The book, "Atomic Force Microscopy" by Peter Eaton and Paul
West was published in March 2010 by OUP.
There is some information about it at this site, but it's somewhat out of date. In particular the contents listing is not quite correct.
Here is the correct contents of "Atomic Force Microscopy":
Preface
Chapter 1: Introduction
1.1 Background to AFM
1.2 AFM today
Chapter 2: Instrumental Aspects of AFM
2.1 Basic concepts in AFM instrumentation
2.2 The AFM stage
2.3 AFM electronics
2.4 Acquisition software
2.5 AFM cantilevers and probes
2.6 AFM instrument environment
2.7 Scanning environment
Chapter 3: AFM Modes
3.1 Topographic modes
3.2 Nontopographic modes
3.3 Surface modification
Chapter 4: Measuring AFM Images
4.1 Sample preparation
4.2 Measuring contact mode images
4.3 Measuring intermittent contact mode images
4.4 High-resolution imaging
4.5 Force curves
Chapter 5: Image Processing in AFM
5.1 Processing AFM images
5.2 Displaying AFM images
5.3 Analysing AFM Images
Chapter 6: Image Artifacts in AFM
6.1 Probe artefacts
6.2 Scanner artefacts
6.3 Image processing artefacts
6.4 Vibration noise
6.5 Noise from other sources
6.6 Other artefacts
Chapter 7: Applications of AFM
7.1 AFM applications in materials science
7.2 AFM applications in nanotechnology
7.3 AFM applications in the life sciences
7.4 Industrial AFM applications
Appendix A: AFM Standards
Appendix B: Scanner Calibration and Certification Procedures
Appendix C: Third Party AFM Software
Index
To buy the book, visit Amazon.com
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At the Atomic Force Blog, I publish occasional opinion articles about new things in AFM that catch my eye. Click below to be redirected to the blog.
http://atomicforceblog.blogspot.com/
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This page has resources to help use the book "Atomic Force Microscopy" for learning and teaching about AFM.
AFM QUIZZES
Here are some quizzes based on the chapters in the book.
- The first quiz is based on Chapter 1 - the introduction to AFM.
Chapter 1: Introduction to AFM Quiz
- The second quiz is based on chapter 2, which is all about AFM instrumentation, and describes in detail how AFM instruments work:
Chapter 2: AFM Instrumentation Quiz
- The third quiz is all about the different modes and experiments available in AFM:
- The fourth quiz covers the chapter on practical aspects of acquiring AFM images and other data:
Chapter 4: Measuring AFM Images Quiz
- The fifth quiz is about processing, analysis and display of AFM data:
Chapter 5: Processing AFM Images Quiz
- The sixth and last quiz is about artifacts in AFM images.
AFM COURSES
I regularly teach AFM courses, which typically feature a mix of lectures and hands-on classes. When there are open classes, they will be announced on the front page of this website. The recurring course in Porto, the Porto AFM Workshop (formerly the Requimte AFM Workshop) is held annually in Porto, Portugal, and is described here.
AFM TEACHING RESOURCES
- AFM Poster - can be a useful aid to show how AFM works in your lab / classroom
- AFM slide - a simple slide showing a schematic of the workings of an AFM
I am happy to receive suggestions on other learning and teaching content that would be useful here, please feel free to This email address is being protected from spambots. You need JavaScript enabled to view it. for this!
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Test for Chapter 1 - Introduction
Chapter 1 is the introduction chapter. Firstly the background to AFM is explained, which techniques preceded it, and how it came to be invented. Then some important characteristics of AFM are discussed, with reference to other microscopy techniques. This is a short chapter, covering briefly some material that occurs in greater details through the rest of the book; for this reason there are only 5 questions here.
Q1. What two major instruments preceded AFM?
Q2. Who invented the AFM and built the first ever instrument?
Q3. Which SPM technique is most commonly used, STM or AFM?
Q4. Which prize was given to the inventors of AFM and why?
Q5. Limitation in imaging what kind of sample limitation lead to the development of the AFM?
Long answer question.
Compare SEM, TEM with AFM. Under what circumstance would AFM be better than SEM, TEM and optical microscopy? Under what circumstance would AFM be worse than SEM, TEM and optical microscopy?
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There is a freely-downloadable .pdf (4.8 MB file) of chapter 1 of my book, "Atomic Force Microscopy" available on the OUP web site. This has the preface and the whole of chapter 1.This chapter contains background to AFM, and describes a few of the capabilities of the technique It explains how the technique was invented, and which instruments preceded it, and why AFM was needed. It also compares AFM to other microscopy techniques. The preface also contains information of the contents of the rest of the book.
The book should be published around 25th of March, pretty soon now!
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